doc. no : qw0905- rev. : date : 04 - apr.- 2005 LUG2640 a data sheet ligitek electronics co.,ltd. property of ligitek only super bright round type led lamps LUG2640
25.0min 0.5 typ -60 x 60 x 25% 100% 75% 50% 50% 25% 0 100% 75% directivity radiation -30 x 30 x 0 x note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 1.0min 2.54typ 4.3 3.3 1.5max package dimensions 3.1 2.9 ligitek electronics co.,ltd. property of ligitek only LUG2640 part no. 1/4 page
note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. typical electrical & optical characteristics (ta=25 j ) max 260 j for 5 sec max (2mm from body) ligitek electronics co.,ltd. property of ligitek only spectral halfwidth ??f nm t opr operating temperature dominant wave length f dnm part no material LUG2640 green diffused algainp green emitted 574 lens color storage temperature soldering temperature tsol tstg power dissipation reverse current @5v electrostatic discharge peak forward current duty 1/10@10khz esd ir pd i fp absolute maximum ratings at ta=25 j parameter forward current i f symbol part no. LUG2640 -40 ~ +85 j viewing angle 2 c 1/2 (deg) 20 forward voltage @ ma(v) luminous intensity @20ma(mcd) 1.7 20 65 2.6 min. max. min. 50 120 typ. -40 ~ +100 j 2000 10 v g a 100 120 mw ma ratings ug 30 ma unit 2/4 page
relative intensity@20ma 550 wavelength (nm) 500 0.0 0.5 650 600 0 fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) forward voltage@20ma normalize @25 j 1.0 0.8 -20 -40 1.1 0.9 1.0 1.2 relative intensity@20ma normalize @25 j ambient temperature( j ) 100 20 40 60 80 0.0 -40 -20 40 20 06080100 fig.4 relative intensity vs. temperature 0.5 1.0 1.5 2.0 3.0 2.5 forward voltage(v) fig.1 forward current vs. forward voltage typical electro-optical characteristics curve forward current(ma) 100 0.1 1.0 2.0 1.0 10 1000 ug chip relative intensity normalize @20ma 2.0 forward current(ma) 5.0 3.0 4.0 1.0 0.0 1.0 0.5 1.5 1000 10 100 fig.2 relative intensity vs. forward current 3.0 2.5 part no. LUG2640 ligitek electronics co.,ltd. property of ligitek only page3/4
mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to see soldering well performed or not. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. thermal shock test solder resistance test high temperature high humidity test 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hous. 4/4 page part no. LUG2640 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) low temperature storage test high temperature storage test the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. test condition test item reliability test: description ligitek electronics co.,ltd. property of ligitek only
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